GATTO*: a PVM-based Distributed Test Pattern Generation Algorithm for Large Sequential Circuits

Due to the continuous increase in the size and complexity of VLSI circuits, Automated Test Pattern Generation (ATPG) [ABFr90] is now a major problem from the industrial and economic point of view. As far as the single stuck-at fault model is considered, efficient algorithms have been devised for combinational and small sequential networks. Very large sequential circuits, however, still constitute a problem. None of the methods proposed so far can fully handle all the real-world circuits test engineers have to deal with, since they either definitely get off or generate sequences with very low fault coverages.